| 1 | /* Check EXECUTE with relative long instructions as targets. */ |
| 2 | #include <stdlib.h> |
| 3 | #include <stdio.h> |
| 4 | |
| 5 | struct test { |
| 6 | const char *name; |
| 7 | long (*func)(long reg, long *cc); |
| 8 | long exp_reg; |
| 9 | long exp_mem; |
| 10 | long exp_cc; |
| 11 | }; |
| 12 | |
| 13 | /* |
| 14 | * Each test sets the MEM_IDXth element of the mem array to MEM and uses a |
| 15 | * single relative long instruction on it. The other elements remain zero. |
| 16 | * This is in order to prevent stumbling upon MEM in random memory in case |
| 17 | * there is an off-by-a-small-value bug. |
| 18 | * |
| 19 | * Note that while gcc supports the ZL constraint for relative long operands, |
| 20 | * clang doesn't, so the assembly code accesses mem[MEM_IDX] using MEM_ASM. |
| 21 | */ |
| 22 | static long mem[0x1000]; |
| 23 | #define MEM_IDX 0x800 |
| 24 | #define MEM_ASM "mem+0x800*8" |
| 25 | |
| 26 | /* Initial %r2 value. */ |
| 27 | #define REG 0x1234567887654321 |
| 28 | |
| 29 | /* Initial mem[MEM_IDX] value. */ |
| 30 | #define MEM 0xfedcba9889abcdef |
| 31 | |
| 32 | /* Initial cc value. */ |
| 33 | #define CC 0 |
| 34 | |
| 35 | /* Relative long instructions and their expected effects. */ |
| 36 | #define FOR_EACH_INSN(F) \ |
| 37 | F(cgfrl, REG, MEM, 2) \ |
| 38 | F(cghrl, REG, MEM, 2) \ |
| 39 | F(cgrl, REG, MEM, 2) \ |
| 40 | F(chrl, REG, MEM, 1) \ |
| 41 | F(clgfrl, REG, MEM, 2) \ |
| 42 | F(clghrl, REG, MEM, 2) \ |
| 43 | F(clgrl, REG, MEM, 1) \ |
| 44 | F(clhrl, REG, MEM, 2) \ |
| 45 | F(clrl, REG, MEM, 1) \ |
| 46 | F(crl, REG, MEM, 1) \ |
| 47 | F(larl, (long)&mem[MEM_IDX], MEM, CC) \ |
| 48 | F(lgfrl, 0xfffffffffedcba98, MEM, CC) \ |
| 49 | F(lghrl, 0xfffffffffffffedc, MEM, CC) \ |
| 50 | F(lgrl, MEM, MEM, CC) \ |
| 51 | F(lhrl, 0x12345678fffffedc, MEM, CC) \ |
| 52 | F(llghrl, 0x000000000000fedc, MEM, CC) \ |
| 53 | F(llhrl, 0x123456780000fedc, MEM, CC) \ |
| 54 | F(lrl, 0x12345678fedcba98, MEM, CC) \ |
| 55 | F(stgrl, REG, REG, CC) \ |
| 56 | F(sthrl, REG, 0x4321ba9889abcdef, CC) \ |
| 57 | F(strl, REG, 0x8765432189abcdef, CC) |
| 58 | |
| 59 | /* Test functions. */ |
| 60 | #define DEFINE_EX_TEST(insn, exp_reg, exp_mem, exp_cc) \ |
| 61 | static long test_ex_ ## insn(long reg, long *cc) \ |
| 62 | { \ |
| 63 | register long r2 asm("r2"); \ |
| 64 | char mask = 0x20; /* make target use %r2 */ \ |
| 65 | long pm, target; \ |
| 66 | \ |
| 67 | r2 = reg; \ |
| 68 | asm("larl %[target],0f\n" \ |
| 69 | "cr %%r0,%%r0\n" /* initial cc */ \ |
| 70 | "ex %[mask],0(%[target])\n" \ |
| 71 | "jg 1f\n" \ |
| 72 | "0: " #insn " %%r0," MEM_ASM "\n" \ |
| 73 | "1: ipm %[pm]\n" \ |
| 74 | : [target] "=&a" (target), [r2] "+r" (r2), [pm] "=r" (pm) \ |
| 75 | : [mask] "a" (mask) \ |
| 76 | : "cc", "memory"); \ |
| 77 | reg = r2; \ |
| 78 | *cc = (pm >> 28) & 3; \ |
| 79 | \ |
| 80 | return reg; \ |
| 81 | } |
| 82 | |
| 83 | #define DEFINE_EXRL_TEST(insn, exp_reg, exp_mem, exp_cc) \ |
| 84 | static long test_exrl_ ## insn(long reg, long *cc) \ |
| 85 | { \ |
| 86 | register long r2 asm("r2"); \ |
| 87 | char mask = 0x20; /* make target use %r2 */ \ |
| 88 | long pm; \ |
| 89 | \ |
| 90 | r2 = reg; \ |
| 91 | asm("cr %%r0,%%r0\n" /* initial cc */ \ |
| 92 | "exrl %[mask],0f\n" \ |
| 93 | "jg 1f\n" \ |
| 94 | "0: " #insn " %%r0," MEM_ASM "\n" \ |
| 95 | "1: ipm %[pm]\n" \ |
| 96 | : [r2] "+r" (r2), [pm] "=r" (pm) \ |
| 97 | : [mask] "a" (mask) \ |
| 98 | : "cc", "memory"); \ |
| 99 | reg = r2; \ |
| 100 | *cc = (pm >> 28) & 3; \ |
| 101 | \ |
| 102 | return reg; \ |
| 103 | } |
| 104 | |
| 105 | FOR_EACH_INSN(DEFINE_EX_TEST) |
| 106 | FOR_EACH_INSN(DEFINE_EXRL_TEST) |
| 107 | |
| 108 | /* Test definitions. */ |
| 109 | #define REGISTER_EX_EXRL_TEST(ex_insn, insn, _exp_reg, _exp_mem, _exp_cc) \ |
| 110 | { \ |
| 111 | .name = #ex_insn " " #insn, \ |
| 112 | .func = test_ ## ex_insn ## _ ## insn, \ |
| 113 | .exp_reg = (_exp_reg), \ |
| 114 | .exp_mem = (_exp_mem), \ |
| 115 | .exp_cc = (_exp_cc), \ |
| 116 | }, |
| 117 | |
| 118 | #define REGISTER_EX_TEST(insn, exp_reg, exp_mem, exp_cc) \ |
| 119 | REGISTER_EX_EXRL_TEST(ex, insn, exp_reg, exp_mem, exp_cc) |
| 120 | |
| 121 | #define REGISTER_EXRL_TEST(insn, exp_reg, exp_mem, exp_cc) \ |
| 122 | REGISTER_EX_EXRL_TEST(exrl, insn, exp_reg, exp_mem, exp_cc) |
| 123 | |
| 124 | static const struct test tests[] = { |
| 125 | FOR_EACH_INSN(REGISTER_EX_TEST) |
| 126 | FOR_EACH_INSN(REGISTER_EXRL_TEST) |
| 127 | }; |
| 128 | |
| 129 | /* Loop over all tests and run them. */ |
| 130 | int main(void) |
| 131 | { |
| 132 | const struct test *test; |
| 133 | int ret = EXIT_SUCCESS; |
| 134 | long reg, cc; |
| 135 | size_t i; |
| 136 | |
| 137 | for (i = 0; i < sizeof(tests) / sizeof(tests[0]); i++) { |
| 138 | test = &tests[i]; |
| 139 | mem[MEM_IDX] = MEM; |
| 140 | cc = -1; |
| 141 | reg = test->func(REG, &cc); |
| 142 | #define ASSERT_EQ(expected, actual) do { \ |
| 143 | if (expected != actual) { \ |
| 144 | fprintf(stderr, "%s: " #expected " (0x%lx) != " #actual " (0x%lx)\n", \ |
| 145 | test->name, expected, actual); \ |
| 146 | ret = EXIT_FAILURE; \ |
| 147 | } \ |
| 148 | } while (0) |
| 149 | ASSERT_EQ(test->exp_reg, reg); |
| 150 | ASSERT_EQ(test->exp_mem, mem[MEM_IDX]); |
| 151 | ASSERT_EQ(test->exp_cc, cc); |
| 152 | #undef ASSERT_EQ |
| 153 | } |
| 154 | |
| 155 | return ret; |
| 156 | } |